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Elektronische_Specklemuster_Interferometrie
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Elektronische_Specklemuster_Interferometrie
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Anwendung von Methoden der Digitalen Speckle-Photographie bei der räumlich phasenschiebenden Elektronischen Specklemuster-Interferometrie
Author:
Dipl.-Phys. Patrik Langehanenberg (Author)
Subject:
Physics - Optics
Category:
Diploma Thesis, 2005
Price:
US$ 36.99
