Excerpt
Contents
1 Introduction
2 Physical Principles
2.1 Near and Far Field
2.1.1 Limitation of Far-Field Measurement
2.1.2 Evanescent Wave Measurement via Slit
2.2 Evanescent Waves and Plasmons
2.3 Plasmon Resonance from Theory
2.4 SNOM Theory
2.4.1 Aperture-Mode
2.4.2 Shear Force Feedback
2.5 Topographic Artifacts
3 Setup
4 Samples
5 Experimental
5.1 Preparation of Measurement
5.2 Measurement Procedure
5.3 Calibration and Tip Properties
5.4 Results
6 Discussion
6.1 Optical Correction by Height
6.2 Correlation between Topography & Near-Field Optics
6.3 Analysis of Contractive Effects - Emission / Absorption
7 Summarizing Conclusion
8 Outlook
9 Appendices
9.1 Equipment
9.2 Program for Data Correction and Display
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- Quote paper
- Steven Kämmer (Author), 2014, Characterisation of metallic particle distributions by scanning near-field optical microscopy (SNOM) in simultaneous reflection and transmission mode, Munich, GRIN Verlag, https://www.grin.com/document/281073
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